Konferenzbeiträge

91
On-wafer residual error correction through adaptive filtering of verification line measurements

On-wafer residual error correction through adaptive filtering of verification line measurements

Arz, Uwe ; Savin, Aleksandr (2019)
DOI: 10.7795/EMPIR.14IND02.CA.20190403F Konferenzartikel
92
Comparison between time-and frequency-domain high-frequency device characterizations

Comparison between time-and frequency-domain high-frequency device characterizations

Bieler, Mark ; Arz, Uwe (2019)
DOI: 10.7795/EMPIR.14IND02.CA.20190403E Konferenzartikel
93
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods

Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods

Bieler, Mark ; Arz, Uwe (2019)
DOI: 10.7795/EMPIR.14IND02.CA.20190403D Konferenzartikel
94
On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz

On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz

Probst, Thorsten ; Zinal, Sherko ; Dörner, Ralf ; Arz, Uwe (2019)
DOI: 10.7795/EMPIR.14IND02.CA.20190403C Konferenzartikel
95
110 GHz on-wafer measurement comparison on alumina substrate

110 GHz on-wafer measurement comparison on alumina substrate

Probst, Thorsten ; Dörner, Ralf ; Ohlrogge, Matthias ; Lozar, Roger ; Arz, Uwe (2019)
DOI: 10.7795/EMPIR.14IND02.CA.20190403A Konferenzartikel
96
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz

Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz

Arz, Uwe ; Zinal, Sherko ; Probst, Thorsten ; Hechtfischer, Gerd ; Schmückle, Franz-Josef ; et al. (2019)
DOI: 10.7795/EMPIR.14IND02.CA.20190403 Konferenzartikel
97

311. PTB-Seminar, Aktuelle Fortschritte von Kalibrierverfahren im Nieder- und Hochfrequenzbereich 2018

Bauer, Martin ; Hahne, Julian ; Steiner, Gerhard ; Wiedenhöfer, Thomas ; Scheibner, Alexander ; et al. (2018)
DOI: 10.7795/810.20180612 Präsentationsfolien
98
Integration of a step gauge measurement capability at the PTB Nanometer Comparator – concept and preliminary tests

Integration of a step gauge measurement capability at the PTB Nanometer Comparator – concept and preliminary tests

Weichert, Christoph ; Bütefisch, Sebastian ; Köning, Rainer ; Flügge, Jens (2017)
DOI: 10.7795/810.20180323G Konferenzartikel
99
Versatile calibration artefact for optical micro-CMMs based on micro-spheres with engineered surface texture

Versatile calibration artefact for optical micro-CMMs based on micro-spheres with engineered surface texture

Thalmann, Rudolf ; Küng, Alain ; Nicolet, Anaïs ; Meli, Felix ; Battagli, Christoph ; et al. (2017)
DOI: 10.7795/810.20180323F Konferenzartikel
100
Metrological set-up for calibrating two dimensional grid plates with sub-micrometre precision

Metrological set-up for calibrating two dimensional grid plates with sub-micrometre precision

Klobucar, Rok ; McCarthy, Michael ; Acko, Bojan (2017)
DOI: 10.7795/810.20180323E Konferenzartikel
101
Traceable measurements of rounded cutting tool edges

Traceable measurements of rounded cutting tool edges

Nicolet, Anaïs ; Meli, Felix (2017)
DOI: 10.7795/810.20180323D Konferenzartikel
102
Characterising the Positioning System of a Dimensional Computed Tomograph (CT)

Characterising the Positioning System of a Dimensional Computed Tomograph (CT)

Bircher, Benjamin A. ; Meli, Felix ; Küng, Alain ; Thalmann, Rudolf (2017)
DOI: 10.7795/810.20180323C Konferenzartikel
103
Clamping of microgears with a compliant string

Clamping of microgears with a compliant string

Jantzen, Stephan ; Meeß, Rudolf ; Stein, Martin ; Kniel, Karin ; Dietzel, Andreas (2017)
DOI: 10.7795/810.20180323B Konferenzartikel
104

Workshop "Electromagnetic Waves and Wind Turbines (EMWT) 2017"

Schrader, Thorsten ; Mihalachi, Marius ; Bredemeyer, Jochen ; Sandmann, Sergei ; Winkel, Benjamin ; et al. (2017)
DOI: 10.7795/810.20180227 Präsentationsfolien
105
Urheberrechtliche Vergütung in der Wissenschaft - exemplarische Meinungen von öffentlich finanzierten Urhebern aus der PTB

Urheberrechtliche Vergütung in der Wissenschaft - exemplarische Meinungen von öffentlich finanzierten Urhebern aus der PTB

Meier, Joachim (2017)
DOI: 10.7795/610.20171110 Präsentationsfolien

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