Title: Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
Authors: Bieler, Mark, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.5, Halbleiterphysik und Magnetismus
Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Resource Type: Text / Article
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: Private use is allowed for non-profit purposes only.
Dates: Available: 2019-04-08
File: Download File (application/pdf) 1.46 MB (1531681 Bytes)
MD5 Checksum: 6b9378e3e00160e38a11955cb8fb72a9
SHA256 Checksum: b75bc879c34f9b96a59ddaecf5cc52609640fe13c77416f24e2aed2679645228
Abstract: A high-frequency interconnect consisting of coplanar and coaxial elements is characterized using time- and frequency domain methods. As frequency-domain technique we employ conventional vector network analysis, while as time-domain technique a recently developed laser-based vector network analyzer is used. For the first time, both methods are compared in the frequency range from 10 GHz to 110 GHz. We obtain good agreement in almost the entire frequency range. Our results pave the way towards mutual independent verification of time- and frequency-domain high-frequency measurement techniques.