|
Ergebnisse der experimentellen Untersuchungen zur Visualisierung der Wirksamkeit von Deflagrationsrohrsicherungen in einer PVC-U Rohrleitung
(2019);
Schmidt, Dirk ; Heidermann, Thomas
DOI:
10.7795/210.20190521A
|
|
NanoWorkshop 2018: Workshop on Reference Nanomaterials
(2018);
Bosse, Harald ; Buhr, Egbert ; Dziomba, Thorsten ; Hodoroaba, Vasile-Dan ; Klein, Tobias ; et al.
DOI:
10.7795/110.20190412
|
|
A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers
(2018);
Mohns, Enrico ; Roeissle, Günter ; Fricke, Sören ; Pauling, Florian
DOI:
10.7795/EMPIR.17NRM01.CA.20190411
|
|
Experimental evaluation of attacks on TESLA-secured time synchronization protocols
(2018);
Teichel, Kristof ; Hildemeier, Gregor
DOI:
10.7795/EMPIR.17IND06.CA.20190410B
|
|
Delayed authentication and delayed measurement application in one-way synchronization
(2018);
Teichel, Kristof ; Sibold, Dieter ; Hildemeier, Gregor
DOI:
10.7795/EMPIR.17IND06.CA.20190410A
|
|
VNA Tools II: Calibrations Involving Eigenvalue Problems
(2019);
Wollensack, Michael ; Hoffmann, Johannes ; Stalder, Daniel ; Ruefenacht, Juerg ; Zeier, Markus
DOI:
10.7795/EMPIR.14IND02.CA.20190404
|
|
On-wafer residual error correction through adaptive filtering of verification line measurements
(2019);
Arz, Uwe ; Savin, Aleksandr
DOI:
10.7795/EMPIR.14IND02.CA.20190403F
|
|
Comparison between time-and frequency-domain high-frequency device characterizations
(2019);
Bieler, Mark ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403E
|
|
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
(2019);
Bieler, Mark ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403D
|
|
On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz
(2019);
Probst, Thorsten ; Zinal, Sherko ; Dörner, Ralf ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403C
|
|
110 GHz on-wafer measurement comparison on alumina substrate
(2019);
Probst, Thorsten ; Dörner, Ralf ; Ohlrogge, Matthias ; Lozar, Roger ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403A
|
|
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz
(2019);
Arz, Uwe ; Zinal, Sherko ; Probst, Thorsten ; Hechtfischer, Gerd ; Schmückle, Franz-Josef ; et al.
DOI:
10.7795/EMPIR.14IND02.CA.20190403
|
|
311. PTB-Seminar, Aktuelle Fortschritte von Kalibrierverfahren im Nieder- und Hochfrequenzbereich 2018
(2018);
Bauer, Martin ; Hahne, Julian ; Steiner, Gerhard ; Wiedenhöfer, Thomas ; Scheibner, Alexander ; et al.
DOI:
10.7795/810.20180612
|
|
Integration of a step gauge measurement capability at the PTB Nanometer Comparator – concept and preliminary tests
(2017);
Weichert, Christoph ; Bütefisch, Sebastian ; Köning, Rainer ; Flügge, Jens
DOI:
10.7795/810.20180323G
|
|
Versatile calibration artefact for optical micro-CMMs based on micro-spheres with engineered surface texture
(2017);
Thalmann, Rudolf ; Küng, Alain ; Nicolet, Anaïs ; Meli, Felix ; Battagli, Christoph ; et al.
DOI:
10.7795/810.20180323F
|
