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A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers
(2018);
Mohns, Enrico ; Roeissle, Günter ; Fricke, Sören ; Pauling, Florian
DOI:
10.7795/EMPIR.17NRM01.CA.20190411
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Experimental evaluation of attacks on TESLA-secured time synchronization protocols
(2018);
Teichel, Kristof ; Hildemeier, Gregor
DOI:
10.7795/EMPIR.17IND06.CA.20190410B
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Delayed authentication and delayed measurement application in one-way synchronization
(2018);
Teichel, Kristof ; Sibold, Dieter ; Hildemeier, Gregor
DOI:
10.7795/EMPIR.17IND06.CA.20190410A
|
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VNA Tools II: Calibrations Involving Eigenvalue Problems
(2019);
Wollensack, Michael ; Hoffmann, Johannes ; Stalder, Daniel ; Ruefenacht, Juerg ; Zeier, Markus
DOI:
10.7795/EMPIR.14IND02.CA.20190404
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On-wafer residual error correction through adaptive filtering of verification line measurements
(2019);
Arz, Uwe ; Savin, Aleksandr
DOI:
10.7795/EMPIR.14IND02.CA.20190403F
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Comparison between time-and frequency-domain high-frequency device characterizations
(2019);
Bieler, Mark ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403E
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Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
(2019);
Bieler, Mark ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403D
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On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz
(2019);
Probst, Thorsten ; Zinal, Sherko ; Dörner, Ralf ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403C
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110 GHz on-wafer measurement comparison on alumina substrate
(2019);
Probst, Thorsten ; Dörner, Ralf ; Ohlrogge, Matthias ; Lozar, Roger ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403A
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Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz
(2019);
Arz, Uwe ; Zinal, Sherko ; Probst, Thorsten ; Hechtfischer, Gerd ; Schmückle, Franz-Josef ; et al.
DOI:
10.7795/EMPIR.14IND02.CA.20190403
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311. PTB-Seminar, Aktuelle Fortschritte von Kalibrierverfahren im Nieder- und Hochfrequenzbereich 2018
(2018);
Bauer, Martin ; Hahne, Julian ; Steiner, Gerhard ; Wiedenhöfer, Thomas ; Scheibner, Alexander ; et al.
DOI:
10.7795/810.20180612
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Integration of a step gauge measurement capability at the PTB Nanometer Comparator – concept and preliminary tests
(2017);
Weichert, Christoph ; Bütefisch, Sebastian ; Köning, Rainer ; Flügge, Jens
DOI:
10.7795/810.20180323G
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Versatile calibration artefact for optical micro-CMMs based on micro-spheres with engineered surface texture
(2017);
Thalmann, Rudolf ; Küng, Alain ; Nicolet, Anaïs ; Meli, Felix ; Battagli, Christoph ; et al.
DOI:
10.7795/810.20180323F
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Metrological set-up for calibrating two dimensional grid plates with sub-micrometre precision
(2017);
Klobucar, Rok ; McCarthy, Michael ; Acko, Bojan
DOI:
10.7795/810.20180323E
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Traceable measurements of rounded cutting tool edges
(2017);
Nicolet, Anaïs ; Meli, Felix
DOI:
10.7795/810.20180323D
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