Other Publications

Delayed authentication and delayed measurement application in one-way synchronization (2019); Teichel, Kristof; Sibold, Dieter; Hildemeier, Gregor; DOI: 10.7795/EMPIR.17IND06.CA.20190410A
Experimental evaluation of attacks on TESLA-secured time synchronization protocols (2019); Teichel, Kristof; Hildemeier, Gregor; DOI: 10.7795/EMPIR.17IND06.CA.20190410B
A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers (2019); Mohns, Enrico; Roeissle, Günter; Fricke, Sören; Pauling, Florian; DOI: 10.7795/EMPIR.17NRM01.CA.20190411
A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider (2019); Mohns, Enrico; Chunyang, Jiang; Badura, Henrik; Räther, Peter; DOI: 10.7795/EMPIR.17NRM01.CA.20190408
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz (2019); Arz, Uwe; Zinal, Sherko; Probst, Thorsten; Hechtfischer, Gerd; Schmückle, Franz-Josef; Heinrich, Wolfgang; DOI: 10.7795/EMPIR.14IND02.CA.20190403
110 GHz on-wafer measurement comparison on alumina substrate (2019); Probst, Thorsten; Dörner, Ralf; Ohlrogge, Matthias; Lozar, Roger; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403A
On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz (2019); Probst, Thorsten; Zinal, Sherko; Dörner, Ralf; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403C
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods (2019); Bieler, Mark; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403D
Comparison between time-and frequency-domain high-frequency device characterizations (2019); Bieler, Mark; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403E
On-wafer residual error correction through adaptive filtering of verification line measurements (2019); Arz, Uwe; Savin, Aleksandr; DOI: 10.7795/EMPIR.14IND02.CA.20190403F
VNA Tools II: Calibrations Involving Eigenvalue Problems (2019); Wollensack, Michael; Hoffmann, Johannes; Stalder, Daniel; Ruefenacht, Juerg; Zeier, Markus; DOI: 10.7795/EMPIR.14IND02.CA.20190404
Urheberrechtliche Vergütung in der Wissenschaft - exemplarische Meinungen von öffentlich finanzierten Urhebern aus der PTB (2017); Meier, Joachim; DOI: 10.7795/610.20171110
§ 52a in der Praxis von Forschungsgruppen, Aspekte der Vergütung (2015); Meier, Joachim; DOI: 10.7795/610.20150622M
Eigensichere "Power-i"-Technologie international auf dem Vormarsch (2015); Gerlach, Udo; Johannsmeyer, Ulrich; DOI: 10.7795/610.20150112U
PTB-Publica (2015); Physikalisch-Technische Bundesanstalt (PTB); DOI: 10.7795/PTBPUBLICAEN