Titel: Characterising the Positioning System of a Dimensional Computed Tomograph (CT)
Autoren: Bircher, Benjamin A., Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Meli, Felix, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland, ORCID: 0000-0001-7575-7540
Küng, Alain, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Thalmann, Rudolf, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Beitragende: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Seiten:8
Sprache:en
DOI:10.7795/810.20180323C
Art der Ressource: Text / Article
Herausgeber: Physikalisch-Technische Bundesanstalt (PTB)
Rechte: https://creativecommons.org/licenses/by/4.0/
CC BY 4.0
Daten: Verfügbar: 2018-03-28
Erstellt: 2017-12-19
Datei: Datei herunterladen (application/pdf) 585.28 kB (599325 Bytes)
MD5 Prüfsumme: fc36d7e638c6722412edf291891d699f
SHA256 Prüfsumme: 4eb7526f5fbb13d8b1d47d21948f9439d44ca8748fdbec5f75f9ebcbd653ea38
Schlagworte: Computed tomography (CT) ; dimensional metrology ; 9 DoF CT geometry
Zusammenfassung: Computed tomography (CT) is increasingly used for dimensional characterisation of workpieces. Therefore, the Federal Institute of Metrology METAS is developing and building a unique metrology CT system to measure workpieces of millimetre dimensions with sub-micrometre resolution, and to study CT metrology and traceability in general. Here, an overview of the CT system is presented and the requirements related to the positioning system and its characterisation are discussed in detail. The results indicate that further in situ measurement systems are required to correct high-resolution CT scans for geometrical errors.
Anderes: This article is based on a presentation at the conference "MacroScale 2017 - Recent developments in traceable dimensional measurements", VTT MIKES Espoo, (Finnland), 17th-19th October 2017.