|
NanoWorkshop 2018: Workshop on Reference Nanomaterials (2019);
Bosse, Harald;
Buhr, Egbert;
Dziomba, Thorsten;
Hodoroaba, Vasile-Dan;
Klein, Tobias;
Krumrey, Michael;
DOI: 10.7795/110.20190412
|
|
Delayed authentication and delayed measurement application in one-way synchronization (2019);
Teichel, Kristof;
Sibold, Dieter;
Hildemeier, Gregor;
DOI: 10.7795/EMPIR.17IND06.CA.20190410A
|
|
Experimental evaluation of attacks on TESLA-secured time synchronization protocols (2019);
Teichel, Kristof;
Hildemeier, Gregor;
DOI: 10.7795/EMPIR.17IND06.CA.20190410B
|
|
Data set for the calibration of torque measurement under constant rotation in a wind turbine test bench (2019);
Weidinger, Paula;
Foyer, Gisa;
Kock, Stefan;
Gnauert, Jonas;
Kumme, Rolf;
DOI: 10.7795/720.20190411
|
|
A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers (2019);
Mohns, Enrico;
Roeissle, Günter;
Fricke, Sören;
Pauling, Florian;
DOI: 10.7795/EMPIR.17NRM01.CA.20190411
|
|
A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider (2019);
Mohns, Enrico;
Chunyang, Jiang;
Badura, Henrik;
Räther, Peter;
DOI: 10.7795/EMPIR.17NRM01.CA.20190408
|
|
Keine falschen Geschwindigkeitsmesswerte bei eso-Einseitensensoren für Fahrzeuge mit LED-Scheinwerfern oder intermittierenden Blinkern (2019);
Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 1.3 "Geschwindigkeit";
DOI: 10.7795/520.20190402
|
|
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz (2019);
Arz, Uwe;
Zinal, Sherko;
Probst, Thorsten;
Hechtfischer, Gerd;
Schmückle, Franz-Josef;
Heinrich, Wolfgang;
DOI: 10.7795/EMPIR.14IND02.CA.20190403
|
|
110 GHz on-wafer measurement comparison on alumina substrate (2019);
Probst, Thorsten;
Dörner, Ralf;
Ohlrogge, Matthias;
Lozar, Roger;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403A
|
|
On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz (2019);
Probst, Thorsten;
Zinal, Sherko;
Dörner, Ralf;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403C
|
|
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods (2019);
Bieler, Mark;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403D
|
|
Comparison between time-and frequency-domain high-frequency device characterizations (2019);
Bieler, Mark;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403E
|
|
On-wafer residual error correction through adaptive filtering of verification line measurements (2019);
Arz, Uwe;
Savin, Aleksandr;
DOI: 10.7795/EMPIR.14IND02.CA.20190403F
|
|
VNA Tools II: Calibrations Involving Eigenvalue Problems (2019);
Wollensack, Michael;
Hoffmann, Johannes;
Stalder, Daniel;
Ruefenacht, Juerg;
Zeier, Markus;
DOI: 10.7795/EMPIR.14IND02.CA.20190404
|
|
Zur Nachprüfbarkeit eines geeichten Messwertes (2019);
Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 1.3 "Geschwindigkeit";
DOI: 10.7795/520.20190214
|
