Title:
Title:
Traceable measurements of rounded cutting tool edges
Authors:
Authors:
Nicolet, Anaïs, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Meli, Felix, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland, ORCID: 0000-0001-7575-7540
Contributors:
Contributors:
HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:
Pages:
8
Languages:
Languages:
en
DOI:
DOI:
10.7795/810.20180323D
Resource Type:
Resource Type:
Text / Article
Publisher:
Publisher:
Physikalisch-Technische Bundesanstalt (PTB)
Rights:
Rights:
https://creativecommons.org/licenses/by/4.0/
CC BY 4.0
Dates:
Dates:
Available: 2018-03-28
Created: 2017-12-19
File:
File:
Download File (application/pdf) 541.26 kB (554246 Bytes)
MD5 Checksum: 379eddfd087325cb41682de841a8db05
SHA256 Checksum: f54afee983155635bb4a1d74a8c7a2f40ef228d5a6239d20215505252ccd9dcd
Keywords:
Keywords:
edge radius ; asymmetric edges ; cutting tools ; micro contour
Abstract:
Abstract:
The edge geometry of a cutting tool is of extreme importance for its performance and thus of great interest to the machine tool industry. The sharp cutting edges are processed to obtain specific edge roundings. Commercially available optical edge shape measuring instruments require suitable calibrated edge artefacts in order to achieve traceability.
This study uses a specially adapted tactile profiler measurement method and a tailored evaluation program for the calibration of various cutting tool edge shapes. For the evaluation, parameterized mathematical models of the ideal edge shape are formulated. The model parameters are then determined by least squares curve fitting over the entire edge zone. Using simulations, this method has proven to be robust for symmetric and asymmetric edges even if large form deviations are present.
Other:
Other:
This article is based on a presentation at the conference "MacroScale 2017 - Recent developments in traceable dimensional measurements", VTT MIKES Espoo, (Finnland), 17th-19th October 2017.

Authors

Nicolet, Anaïs, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland
Meli, Felix, Federal Institute of Metrology METAS, Laboratory for Length, Nano- and Microtechnology, Bern-Wabern, Switzerland, ORCID: 0000-0001-7575-7540

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