Konferenzartikel

Ball and hole plate development for evaluation of μCMM (2013); Kruger, O.; v. d. Walt, F.; Greeff, P.; DOI: 10.7795/810.20130620B
Calibration of photomasks for optical coordinate metrology (2013); Meli, Felix; DOI: 10.7795/810.20130620C
Temperature measurement in dimensional metrology – Why the Steinhart-Hart equation works so well (2013); Matus, Michael; DOI: 10.7795/810.20130620D
Precision angle comparator using self-calibration of scale errors based on the equal-division-averaged method (2013); Kim, Jong-Ahn; Kim, Jae Wan; Kang, Chu-Shik; Jin, Jonghan; Eom, Tae Bong; DOI: 10.7795/810.20130620F
Scanning phase shift interferometry in length measurement (2013); Bartl, Guido; Schödel, Renè; DOI: 10.7795/810.20130620G
Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer (2013); Pisani, Marco; Zucco, Massimo; DOI: 10.7795/810.20130620K
Synthetic wavelength based transportable telemeter with submicrometer resolution (2013); Azouigui, Sheherazade; Wallerand, Jean-Pierre; Badr, Thomas; van den Berg, Steven; Himbert, Marc; et al. DOI: 10.7795/810.20130620M
The INRIM 1D comparator with a new interferometric set-up for measurement of diameter gauges and linear artefacts (2013); Picotto, Gian Bartolo; Belotti, Roberto; Pometto, Marco; Santiano, Marco; DOI: 10.7795/810.20130620O
Uncertainty estimation for comb based laser calibrations by direct comparison of 3 different combs (2013); Matus, Michael; Balling, Petr; Mache, Werner; Nießner, Anton; Kren, Petr; DOI: 10.7795/810.20130620Q
Towards traceable bidirectional optical size measurements for optical coordinate measuring machine metrology (2013); Köning, Rainer; Bodermann, Bernd; Bergmann, Detlef; Buhr, Egbert; Häßler-Grohne, Wolfgang; et al. DOI: 10.7795/810.20130620R
Determination of misalignment and angular scale errors of a laser tracker using a new geometric model and a multi-target network approach (2013); Lewis, Andrew; Hughes, Ben; Forbes, Alistair; Sun, Wenjuan; Veal, Dan; et al. DOI: 10.7795/810.20130620S
High-precision measurements of the thermal expansion at cryogenic temperature on stable materials (2013); Roose, Stéphane; Heltzel, Stan; DOI: 10.7795/810.20130822T