| Titel: |
Titel:
Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer
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| Autoren: |
Autoren:
Pisani, Marco, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, ItalyZucco, Massimo, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy |
| Beitragende: |
Beitragende:
HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
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| Seiten: |
Seiten:
6
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| Sprachen: |
Sprachen:
en
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| DOI: |
DOI:
10.7795/810.20130620K
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| Art der Ressource: |
Art der Ressource:
PTB: Konferenzartikel,
DINI: ConferencePaper,
DataCite: ConferencePaper
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| Verlag: |
Verlag:
Physikalisch-Technische Bundesanstalt (PTB)
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| Erscheinungsjahr: |
Erscheinungsjahr:
2013
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| Datumsangaben: |
Datumsangaben:
Verfügbar:
2013
Herausgegeben: 2013-08 |
| Datei: |
Datei:
Datei herunterladen
(application/pdf)
417.3 KB
MD5 Prüfsumme: ee64778638f6048fa5250c0d701a05be SHA256 Prüfsumme: 596b060b588157eb45600cb378941fcdaf8608b9131169ebae7cbc12648aeafc 
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| Stichwörter: |
Stichwörter:
absolute interferometry ;
synthetic wavelength
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| Zusammenfassung: |
Zusammenfassung:
A possible technique to measure absolute distances is presented. It is based on a Michelson interferometer where two tuneable lasers are superposed to create a very short synthetic wavelength. By exploiting relative and absolute interferometry theories merged together in a demonstrator experiment we have shown the possibility of absolute distance measurements with sub-fringe resolution.
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| Anderes: |
Anderes:
article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011 |
| Zitat: |
Zitat:
PISANI, Marco and Massimo ZUCCO. Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer. Physikalisch-Technische Bundesanstalt (PTB), 2013. doi: 10.7795/810.20130620K
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| Bemerkung: |
Bemerkung:
article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011
|