Title: Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer
Authors: Pisani, Marco, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Zucco, Massimo, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:6
Language:en
DOI:10.7795/810.20130620K
Resource Type: Text / Report
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Dates: Available: 2013
Issued: 2013-08
File: Download File (application/pdf) 417.29 kB (427306 Bytes)
MD5 Checksum: ee64778638f6048fa5250c0d701a05be
SHA256 Checksum: 596b060b588157eb45600cb378941fcdaf8608b9131169ebae7cbc12648aeafc
Keywords: absolute interferometry ; synthetic wavelength
Abstract: A possible technique to measure absolute distances is presented. It is based on a Michelson interferometer where two tuneable lasers are superposed to create a very short synthetic wavelength. By exploiting relative and absolute interferometry theories merged together in a demonstrator experiment we have shown the possibility of absolute distance measurements with sub-fringe resolution.
Other: article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements",
Bern-Wabern (Switzerland), 04-06, October, 2011
Citation: PISANI, Marco and Massimo ZUCCO. Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer. Physikalisch-Technische Bundesanstalt (PTB), 2013. doi: 10.7795/810.20130620K
Remark: article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011