Title:
Title:
Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer
Authors:
Authors:
Pisani, Marco, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Zucco, Massimo, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Contributors:
Contributors:
HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:
Pages:
6
Languages:
Languages:
en
DOI:
DOI:
10.7795/810.20130620K
Resource Type:
Resource Type:
PTB: Conference Article, DINI: ConferencePaper, DataCite: ConferencePaper
Publisher:
Publisher:
Physikalisch-Technische Bundesanstalt (PTB)
Dates:
Dates:
Available: 2013
Issued: 2013-08
File:
File:
Download File (application/pdf) 417.3 KB
MD5 Checksum: ee64778638f6048fa5250c0d701a05be
SHA256 Checksum: 596b060b588157eb45600cb378941fcdaf8608b9131169ebae7cbc12648aeafc
Keywords:
Keywords:
absolute interferometry ; synthetic wavelength
Abstract:
Abstract:
A possible technique to measure absolute distances is presented. It is based on a Michelson interferometer where two tuneable lasers are superposed to create a very short synthetic wavelength. By exploiting relative and absolute interferometry theories merged together in a demonstrator experiment we have shown the possibility of absolute distance measurements with sub-fringe resolution.
Other:
Other:
article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements",
Bern-Wabern (Switzerland), 04-06, October, 2011
Citation:
Citation:
PISANI, Marco and Massimo ZUCCO. Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer. Physikalisch-Technische Bundesanstalt (PTB), 2013. doi: 10.7795/810.20130620K
Remark:
Remark:
article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011

Authors

Pisani, Marco, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Zucco, Massimo, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy

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