| Titel: | Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer |
| Autoren: |
Pisani, Marco, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy Zucco, Massimo, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy |
| Beitragende: | HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887 |
| Seiten: | 6 |
| Sprache: | en |
| DOI: | 10.7795/810.20130620K |
| Art der Ressource: | Text / Report |
| Herausgeber: | Physikalisch-Technische Bundesanstalt (PTB) |
| Daten: |
Verfügbar: 2013 Veröffentlicht: 2013-08 |
| Datei: |
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| Schlagworte | absolute interferometry ; synthetic wavelength |
| Zusammenfassung: | A possible technique to measure absolute distances is presented. It is based on a Michelson interferometer where two tuneable lasers are superposed to create a very short synthetic wavelength. By exploiting relative and absolute interferometry theories merged together in a demonstrator experiment we have shown the possibility of absolute distance measurements with sub-fringe resolution. |
| Anderes: | article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011 |
| Zitierform: | PISANI, Marco and Massimo ZUCCO. Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer. Physikalisch-Technische Bundesanstalt (PTB), 2013. doi: 10.7795/810.20130620K |
| Bemerkung: | article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011 |