Titel: Renewal of the gage-block interferometer at INRIM
Autoren: Bellotti, Roberto, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Franco, Mauro, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Picotto, Gian Bartolo, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Pometto, Marco, Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy
Beitragende: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Seiten:5
Sprache:en
DOI:10.7795/810.20150331A
Art der Ressource: Text / Article
Herausgeber: Physikalisch-Technische Bundesanstalt (PTB)
Daten: Verfügbar: 2015-04-02
Klassifikationen: OCIS 120.3940 ; OCIS 120.3180
Datei: Datei herunterladen (application/pdf) 298.10 kB (305257 Bytes)
MD5 Prüfsumme: 2d989a890ba577083694e41e1424e0af
SHA256 Prüfsumme: 61ec0a1b4ff2d2c6a2e50596e6cfcfaf60ceb4b07d6389be638dcbc284dfcd3c
Schlagworte gage block ; interferometry ; excess fractions ; fringe analysis ; metrology ; INRIM
Zusammenfassung: The Hilger and Watts interferometer in use at INRIM for the calibration of gage blocks up to 100 mm has been recently upgraded with stabilized He-Ne laser sources providing traceable wavelengths at 633 nm, 543 nm and 594 nm. The new set-up has been validated by an internal comparison with reference gage blocks in use for the periodical verification of the overall measuring system. The fringe order ambiguity determined with the exact fractions method by using the two wavelengths at 633 nm and 543 nm has been tested and compared with that obtained by using all the three wavelengths.
Anderes: This article is based on a presentation at the conference "MacroScale 2014 - Recent developments in traceable dimensional measurements", Vienna (Austria), 28th-30th October 2014.
Zitierform: BELLOTTI, Roberto, Mauro FRANCO, Gian Bartolo PICOTTO and Marco POMETTO. Renewal of the gage-block interferometer at INRIM. Physikalisch-Technische Bundesanstalt (PTB), 2015. doi: 10.7795/810.20150331A
Bemerkung: This article is based on a presentation at the conference "MacroScale 2014 - Recent developments in traceable dimensional measurements", Vienna (Austria), 28th-30th October 2014.