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Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers : EMPIR - 14IND02 PlanarCal
(2018);
Arz, Uwe ; Probst, Thorsten ; Kuhlmann, Karsten ; Ridler, Nick ; Shang, Xiaobang ; et al.
DOI:
10.7795/530.20190424B
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Guidelines for the design of calibration substrates, including the suppression of parasitic modes for frequencies up to and including 325 GHz : EMPIR 14IND02
(2018);
Spirito, Marco ; Arz, Uwe ; Phung, Gia Ngoc ; Schmückle, Franz Josef ; Heinrich, Wolfgang ; et al.
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10.7795/530.20190424A
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NanoWorkshop 2018: Workshop on Reference Nanomaterials
(2018);
Bosse, Harald ; Buhr, Egbert ; Dziomba, Thorsten ; Hodoroaba, Vasile-Dan ; Klein, Tobias ; et al.
DOI:
10.7795/110.20190412
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A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers
(2018);
Mohns, Enrico ; Roeissle, Günter ; Fricke, Sören ; Pauling, Florian
DOI:
10.7795/EMPIR.17NRM01.CA.20190411
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Dataset for the calibration of torque measurement under constant rotation in a wind turbine test bench
(2017);
Weidinger, Paula ; Foyer, Gisa ; Kock, Stefan ; Gnauert, Jonas ; Kumme, Rolf
DOI:
10.7795/720.20190411
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Experimental evaluation of attacks on TESLA-secured time synchronization protocols
(2018);
Teichel, Kristof ; Hildemeier, Gregor
DOI:
10.7795/EMPIR.17IND06.CA.20190410B
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Delayed authentication and delayed measurement application in one-way synchronization
(2018);
Teichel, Kristof ; Sibold, Dieter ; Hildemeier, Gregor
DOI:
10.7795/EMPIR.17IND06.CA.20190410A
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Zur Nachprüfbarkeit eines geeichten Messwertes
(2019);
Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 1.3 "Geschwindigkeit"
DOI:
10.7795/520.20190214
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A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider
(2019);
Mohns, Enrico ; Chunyang, Jiang ; Badura, Henrik ; Räther, Peter
DOI:
10.7795/EMPIR.17NRM01.CA.20190408
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VNA Tools II: Calibrations Involving Eigenvalue Problems
(2019);
Wollensack, Michael ; Hoffmann, Johannes ; Stalder, Daniel ; Ruefenacht, Juerg ; Zeier, Markus
DOI:
10.7795/EMPIR.14IND02.CA.20190404
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On-wafer residual error correction through adaptive filtering of verification line measurements
(2019);
Arz, Uwe ; Savin, Aleksandr
DOI:
10.7795/EMPIR.14IND02.CA.20190403F
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Comparison between time-and frequency-domain high-frequency device characterizations
(2019);
Bieler, Mark ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403E
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Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
(2019);
Bieler, Mark ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403D
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On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz
(2019);
Probst, Thorsten ; Zinal, Sherko ; Dörner, Ralf ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403C
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110 GHz on-wafer measurement comparison on alumina substrate
(2019);
Probst, Thorsten ; Dörner, Ralf ; Ohlrogge, Matthias ; Lozar, Roger ; Arz, Uwe
DOI:
10.7795/EMPIR.14IND02.CA.20190403A
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