All Resources

NanoWorkshop 2018: Workshop on Reference Nanomaterials (2019); Bosse, Harald; Buhr, Egbert; Dziomba, Thorsten; Hodoroaba, Vasile-Dan; Klein, Tobias; Krumrey, Michael; DOI: 10.7795/110.20190412
Delayed authentication and delayed measurement application in one-way synchronization (2019); Teichel, Kristof; Sibold, Dieter; Hildemeier, Gregor; DOI: 10.7795/EMPIR.17IND06.CA.20190410A
Experimental evaluation of attacks on TESLA-secured time synchronization protocols (2019); Teichel, Kristof; Hildemeier, Gregor; DOI: 10.7795/EMPIR.17IND06.CA.20190410B
Dataset for the calibration of torque measurement under constant rotation in a wind turbine test bench (2019); Weidinger, Paula; Foyer, Gisa; Kock, Stefan; Gnauert, Jonas; Kumme, Rolf; DOI: 10.7795/720.20190411
A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers (2019); Mohns, Enrico; Roeissle, Günter; Fricke, Sören; Pauling, Florian; DOI: 10.7795/EMPIR.17NRM01.CA.20190411
A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider (2019); Mohns, Enrico; Chunyang, Jiang; Badura, Henrik; Räther, Peter; DOI: 10.7795/EMPIR.17NRM01.CA.20190408
Keine falschen Geschwindigkeitsmesswerte bei eso-Einseitensensoren für Fahrzeuge mit LED-Scheinwerfern oder intermittierenden Blinkern (2019); Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 1.3 "Geschwindigkeit"; DOI: 10.7795/520.20190402
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz (2019); Arz, Uwe; Zinal, Sherko; Probst, Thorsten; Hechtfischer, Gerd; Schmückle, Franz-Josef; Heinrich, Wolfgang; DOI: 10.7795/EMPIR.14IND02.CA.20190403
110 GHz on-wafer measurement comparison on alumina substrate (2019); Probst, Thorsten; Dörner, Ralf; Ohlrogge, Matthias; Lozar, Roger; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403A
On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz (2019); Probst, Thorsten; Zinal, Sherko; Dörner, Ralf; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403C
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods (2019); Bieler, Mark; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403D
Comparison between time-and frequency-domain high-frequency device characterizations (2019); Bieler, Mark; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403E
On-wafer residual error correction through adaptive filtering of verification line measurements (2019); Arz, Uwe; Savin, Aleksandr; DOI: 10.7795/EMPIR.14IND02.CA.20190403F
VNA Tools II: Calibrations Involving Eigenvalue Problems (2019); Wollensack, Michael; Hoffmann, Johannes; Stalder, Daniel; Ruefenacht, Juerg; Zeier, Markus; DOI: 10.7795/EMPIR.14IND02.CA.20190404
Zur Nachprüfbarkeit eines geeichten Messwertes (2019); Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 1.3 "Geschwindigkeit"; DOI: 10.7795/520.20190214