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Precision angle comparator using self-calibration of scale errors based on the equal-division-averaged method (2013);
Kim, Jong-Ahn;
Kim, Jae Wan;
Kang, Chu-Shik;
Jin, Jonghan;
Eom, Tae Bong;
DOI: 10.7795/810.20130620F
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Scanning phase shift interferometry in length measurement (2013);
Bartl, Guido;
Schödel, Renè;
DOI: 10.7795/810.20130620G
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Subnanometer absolute measurements by means of mixed synthetic-optical homodyne interferometer (2013);
Pisani, Marco;
Zucco, Massimo;
DOI: 10.7795/810.20130620K
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Synthetic wavelength based transportable telemeter with submicrometer resolution (2013);
Azouigui, Sheherazade;
Wallerand, Jean-Pierre;
Badr, Thomas;
van den Berg, Steven;
Himbert, Marc;
Juncar, Patrick;
DOI: 10.7795/810.20130620M
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The INRIM 1D comparator with a new interferometric set-up for measurement of diameter gauges and linear artefacts (2013);
Picotto, Gian Bartolo;
Belotti, Roberto;
Pometto, Marco;
Santiano, Marco;
DOI: 10.7795/810.20130620O
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Uncertainty estimation for comb based laser calibrations by direct comparison of 3 different combs (2013);
Matus, Michael;
Balling, Petr;
Mache, Werner;
Nießner, Anton;
Kren, Petr;
DOI: 10.7795/810.20130620Q
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Towards traceable bidirectional optical size measurements for optical coordinate measuring machine metrology (2013);
Köning, Rainer;
Bodermann, Bernd;
Bergmann, Detlef;
Buhr, Egbert;
Häßler-Grohne, Wolfgang;
Flügge, Jens;
Bosse, Harald;
DOI: 10.7795/810.20130620R
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Determination of misalignment and angular scale errors of a laser tracker using a new geometric model and a multi-target network approach (2013);
Lewis, Andrew;
Hughes, Ben;
Forbes, Alistair;
Sun, Wenjuan;
Veal, Dan;
Nasr, Karim;
DOI: 10.7795/810.20130620S
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High-precision measurements of the thermal expansion at cryogenic temperature on stable materials (2013);
Roose, Stéphane;
Heltzel, Stan;
DOI: 10.7795/810.20130822T
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Tailored minimum sidelobe and minimum sidelobe cosine-sum windows. Version 1.0, A catalog (2012);
Albrecht, Hans-Helge;
DOI: 10.7795/110.20121022AA
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