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Modulation-based long-range interferometry as basis for an optical two-color temperature sensor (2020);
Röse, Anni;
Liu, Yang;
Köchert, Paul;
Prellinger, Günther;
Manske, Eberhard;
et al. DOI: 10.7795/EMPIR.18SIB01.CA.20200818
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Documented feedback from the end-users who attended the workshop on rectangular waveguide interfaces for connections above 100 GHz (2020);
Ridler, Nick;
Kuhlmann, Karsten;
Watts, James;
DOI: 10.7795/EMPIR.17SIP08.CA.20200324
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Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range (2019);
Judaschke, Rolf;
Kehrt, Mathias;
Steiger, Andreas;
DOI: 10.7795/EMPIR.18SIB09.CA.20200207
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The thermal boundary layer effects on line-of-sight TDLAS gas concentration measurements (2020);
Qu, Zhechao;
Werhahn, Olav;
Ebert, Volker;
DOI: 10.7795/EMPIR.16ENV08.JA.20200130
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Guards and Watchdogs in One-Way Synchronization with Delay-Related Authentication Mechanisms (2019);
Langer, Martin;
Teichel, Kristof;
Heine, Kai;
Sibold, Dieter;
Bermbach, Rainer;
DOI: 10.7795/EMPIR.17IND06.CA.20191126
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Setup and Characterisation of Reference Current-to-Voltage Transformers for Wideband Current Transformers Calibration up to 2 kA (2019);
Chen, Yeying;
Mohns, Enrico;
Badura, Henrik;
Räther, Peter;
Luiso, Mario;
DOI: 10.7795/EMPIR.17IND06.CA.20191122
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A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers (2018);
Mohns, Enrico;
Roeissle, Günter;
Fricke, Sören;
Pauling, Florian;
DOI: 10.7795/EMPIR.17NRM01.CA.20190411
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Delayed authentication and delayed measurement application in one-way synchronization (2018);
Teichel, Kristof;
Sibold, Dieter;
Hildemeier, Gregor;
DOI: 10.7795/EMPIR.17IND06.CA.20190410A
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Experimental evaluation of attacks on TESLA-secured time synchronization protocols (2018);
Teichel, Kristof;
Hildemeier, Gregor;
DOI: 10.7795/EMPIR.17IND06.CA.20190410B
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A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider (2019);
Mohns, Enrico;
Chunyang, Jiang;
Badura, Henrik;
Räther, Peter;
DOI: 10.7795/EMPIR.17NRM01.CA.20190408
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On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz (2019);
Probst, Thorsten;
Zinal, Sherko;
Dörner, Ralf;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403C
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Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods (2019);
Bieler, Mark;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403D
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Comparison between time-and frequency-domain high-frequency device characterizations (2019);
Bieler, Mark;
Arz, Uwe;
DOI: 10.7795/EMPIR.14IND02.CA.20190403E
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On-wafer residual error correction through adaptive filtering of verification line measurements (2019);
Arz, Uwe;
Savin, Aleksandr;
DOI: 10.7795/EMPIR.14IND02.CA.20190403F
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Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz (2019);
Arz, Uwe;
Zinal, Sherko;
Probst, Thorsten;
Hechtfischer, Gerd;
Schmückle, Franz-Josef;
et al. DOI: 10.7795/EMPIR.14IND02.CA.20190403
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