Other Publications

Modulation-based long-range interferometry as basis for an optical two-color temperature sensor (2020); Röse, Anni; Liu, Yang; Köchert, Paul; Prellinger, Günther; Manske, Eberhard; et al. DOI: 10.7795/EMPIR.18SIB01.CA.20200818
Documented feedback from the end-users who attended the workshop on rectangular waveguide interfaces for connections above 100 GHz (2020); Ridler, Nick; Kuhlmann, Karsten; Watts, James; DOI: 10.7795/EMPIR.17SIP08.CA.20200324
Comparison of Waveguide and Free-Space Power Measurement in the Millimeter-Wave Range (2019); Judaschke, Rolf; Kehrt, Mathias; Steiger, Andreas; DOI: 10.7795/EMPIR.18SIB09.CA.20200207
The thermal boundary layer effects on line-of-sight TDLAS gas concentration measurements (2020); Qu, Zhechao; Werhahn, Olav; Ebert, Volker; DOI: 10.7795/EMPIR.16ENV08.JA.20200130
Guards and Watchdogs in One-Way Synchronization with Delay-Related Authentication Mechanisms (2019); Langer, Martin; Teichel, Kristof; Heine, Kai; Sibold, Dieter; Bermbach, Rainer; DOI: 10.7795/EMPIR.17IND06.CA.20191126
Setup and Characterisation of Reference Current-to-Voltage Transformers for Wideband Current Transformers Calibration up to 2 kA (2019); Chen, Yeying; Mohns, Enrico; Badura, Henrik; Räther, Peter; Luiso, Mario; DOI: 10.7795/EMPIR.17IND06.CA.20191122
A Sampling-Based Ratio Bridge for Calibrating Voltage Transformers (2018); Mohns, Enrico; Roeissle, Günter; Fricke, Sören; Pauling, Florian; DOI: 10.7795/EMPIR.17NRM01.CA.20190411
Delayed authentication and delayed measurement application in one-way synchronization (2018); Teichel, Kristof; Sibold, Dieter; Hildemeier, Gregor; DOI: 10.7795/EMPIR.17IND06.CA.20190410A
Experimental evaluation of attacks on TESLA-secured time synchronization protocols (2018); Teichel, Kristof; Hildemeier, Gregor; DOI: 10.7795/EMPIR.17IND06.CA.20190410B
A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider (2019); Mohns, Enrico; Chunyang, Jiang; Badura, Henrik; Räther, Peter; DOI: 10.7795/EMPIR.17NRM01.CA.20190408
On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz (2019); Probst, Thorsten; Zinal, Sherko; Dörner, Ralf; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403C
Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods (2019); Bieler, Mark; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403D
Comparison between time-and frequency-domain high-frequency device characterizations (2019); Bieler, Mark; Arz, Uwe; DOI: 10.7795/EMPIR.14IND02.CA.20190403E
On-wafer residual error correction through adaptive filtering of verification line measurements (2019); Arz, Uwe; Savin, Aleksandr; DOI: 10.7795/EMPIR.14IND02.CA.20190403F
Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz (2019); Arz, Uwe; Zinal, Sherko; Probst, Thorsten; Hechtfischer, Gerd; Schmückle, Franz-Josef; et al. DOI: 10.7795/EMPIR.14IND02.CA.20190403