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A fundamental step-up method for standard voltage transformers based on an active capacitive high-voltage divider
(2019);
Mohns, Enrico;
Chunyang, Jiang;
Badura, Henrik;
Räther, Peter;
DOI:
10.7795/EMPIR.17NRM01.CA.20190408
|
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Establishing traceability for on-wafer S-parameter measurements of membrane technology devices up to 110 GHz
(2019);
Arz, Uwe;
Zinal, Sherko;
Probst, Thorsten;
Hechtfischer, Gerd;
Schmückle, Franz-Josef;
et al.
DOI:
10.7795/EMPIR.14IND02.CA.20190403
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110 GHz on-wafer measurement comparison on alumina substrate
(2019);
Probst, Thorsten;
Dörner, Ralf;
Ohlrogge, Matthias;
Lozar, Roger;
Arz, Uwe;
DOI:
10.7795/EMPIR.14IND02.CA.20190403A
|
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On the importance of calibration standards definitions for on-wafer measurements up to 110 GHz
(2019);
Probst, Thorsten;
Zinal, Sherko;
Dörner, Ralf;
Arz, Uwe;
DOI:
10.7795/EMPIR.14IND02.CA.20190403C
|
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Characterization of high-frequency interconnects: Comparison between time- and frequency-domain methods
(2019);
Bieler, Mark;
Arz, Uwe;
DOI:
10.7795/EMPIR.14IND02.CA.20190403D
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Comparison between time-and frequency-domain high-frequency device characterizations
(2019);
Bieler, Mark;
Arz, Uwe;
DOI:
10.7795/EMPIR.14IND02.CA.20190403E
|
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On-wafer residual error correction through adaptive filtering of verification line measurements
(2019);
Arz, Uwe;
Savin, Aleksandr;
DOI:
10.7795/EMPIR.14IND02.CA.20190403F
|
|
VNA Tools II: Calibrations Involving Eigenvalue Problems
(2019);
Wollensack, Michael;
Hoffmann, Johannes;
Stalder, Daniel;
Ruefenacht, Juerg;
Zeier, Markus;
DOI:
10.7795/EMPIR.14IND02.CA.20190404
|
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Urheberrechtliche Vergütung in der Wissenschaft - exemplarische Meinungen von öffentlich finanzierten Urhebern aus der PTB
(2017);
Meier, Joachim;
DOI:
10.7795/610.20171110
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§ 52a [UrhG] in der Praxis von Forschungsgruppen, Aspekte der Vergütung
(2015);
Meier, Joachim;
DOI:
10.7795/610.20150622M
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Eigensichere "Power-i"-Technologie international auf dem Vormarsch
(2015);
Gerlach, Udo;
Johannsmeyer, Ulrich;
DOI:
10.7795/610.20150112U
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PTB-Publica
(2015);
Physikalisch-Technische Bundesanstalt (PTB);
DOI:
10.7795/PTBPUBLICAEN
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PTB-Publica
(2015);
Physikalisch-Technische Bundesanstalt (PTB);
DOI:
10.7795/PTBPUBLICAGR
|
