| Title: | Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides |
| Authors: |
Phung, Gia Ngoc, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0001-7157-1263 Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0003-0372-2626 |
| Contributors: | HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887 |
| Pages: | 4 |
| Language: | en |
| DOI: | 10.7795/EMPIR.18SIB09.CA.20220915B |
| Resource Type: | Text / Article |
| Publisher: | Physikalisch-Technische Bundesanstalt (PTB) |
| Rights: | Private use is allowed for non-profit purposes only. |
| Dates: |
Available: 2022-09-21 Created: 2021-11-09 |
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| Keywords | conductor-backed coplanar waveguides ; calibration ; parallel-plate-line ; microstrip mode ; probes ; radiation |
| Abstract: | Recently, parasitic effects in on-wafer measurements have been investigated thoroughly and can be classified as stemming from probe effects, multimode propagation, crosstalk between adjacent structures and radiation effects. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully clarified yet. Therefore, this paper demonstrates how parasitic modes and probe effects deteriorate calibrated S-parameters of CB-CPW structures. |
| Citation: | G. N. Phung and U. Arz, "Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides," in 2021 Kleinheubach Conference, 2021, pp. 1-4, doi: 10.23919/IEEECONF54431.2021.9598396 |
| Funding: | European Commission (EC, ISNI: 0000 0001 2162 673X, Grant Title: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies, Grant Number: EMPIR 18SIB09 |