Title: Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
Authors: Phung, Gia Ngoc, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0001-7157-1263
Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0003-0372-2626
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:4
Language:en
DOI:10.7795/EMPIR.18SIB09.CA.20220915B
Resource Type: Text / Article
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: Private use is allowed for non-profit purposes only.
Dates: Available: 2022-09-21
Created: 2021-11-09
File: Download File (application/pdf) 6.06 MB (6356660 Bytes)
MD5 Checksum: 45018f9a5e2ca7d3a5952e8fc4f7b0ff
SHA256 Checksum: b4bca470d3be818abd3e1b8a2792b2a4e80c351c8a1398d5049fd4b8bac4738c
Keywords: conductor-backed coplanar waveguides ; calibration ; parallel-plate-line ; microstrip mode ; probes ; radiation
Abstract: Recently, parasitic effects in on-wafer measurements have been investigated thoroughly and can be classified as stemming from probe effects, multimode propagation, crosstalk between adjacent structures and radiation effects. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully clarified yet. Therefore, this paper demonstrates how parasitic modes and probe effects deteriorate calibrated S-parameters of CB-CPW structures.
Citation: G. N. Phung and U. Arz, "Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides," in 2021 Kleinheubach Conference, 2021, pp. 1-4, doi: 10.23919/IEEECONF54431.2021.9598396
Funding: European Commission (EC, ISNI: 0000 0001 2162 673X, Grant Title: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies, Grant Number: EMPIR 18SIB09