| Titel: |
Titel:
Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides
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| Autoren: |
Autoren:
Phung, Gia Ngoc, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0001-7157-1263Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0003-0372-2626 |
| Beitragende: |
Beitragende:
HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
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| Seiten: |
Seiten:
4
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| Sprachen: |
Sprachen:
en
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| DOI: |
DOI:
10.7795/EMPIR.18SIB09.CA.20220915B
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| Art der Ressource: |
Art der Ressource:
Text / Article
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| Verlag: |
Verlag:
Physikalisch-Technische Bundesanstalt (PTB)
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| Rechte: |
Rechte:
Private use is allowed for non-profit purposes only.
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| Datumsangaben: |
Datumsangaben:
Verfügbar: 2022-09-21 Erstellt: 2021-11-09 |
| Datei: |
Datei:
Datei herunterladen
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MD5 Prüfsumme: 45018f9a5e2ca7d3a5952e8fc4f7b0ff SHA256 Prüfsumme: b4bca470d3be818abd3e1b8a2792b2a4e80c351c8a1398d5049fd4b8bac4738c |
| Stichwörter: |
Stichwörter:
conductor-backed coplanar waveguides ;
calibration ;
parallel-plate-line ;
microstrip mode ;
probes ;
radiation
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| Zusammenfassung: |
Zusammenfassung:
Recently, parasitic effects in on-wafer measurements have been investigated thoroughly and can be classified as stemming from probe effects, multimode propagation, crosstalk between adjacent structures and radiation effects. While a lot of investigations have been performed for conventional coplanar waveguides (CPW) measured on ceramic chucks, the parasitic effects occuring in conductor-backed CPWs (CB-CPWs) have not been fully clarified yet. Therefore, this paper demonstrates how parasitic modes and probe effects deteriorate calibrated S-parameters of CB-CPW structures.
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| Zitat: |
Zitat:
G. N. Phung and U. Arz, "Parasitic Probe Effects in Measurements of Conductor-Backed Coplanar Waveguides," in 2021 Kleinheubach Conference, 2021, pp. 1-4, doi: 10.23919/IEEECONF54431.2021.9598396
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| Förderung: |
Förderung:
European Commission (EC, ISNI: 0000 0001 2162 673X, Grant Title: Traceability for electrical measurements at millimetre-wave and terahertz frequencies for communications and electronics technologies, Grant Number: EMPIR 18SIB09
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