Title: Physically Based Rendering Method to Derive Realistic Simulation of Chromatic Confocal Measurements
Authors: Linnert, Dan, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 5.3, Koordinatenmesstechnik
Stavridis, Manuel, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 8.4, Mathematische Modellierung und Datenanalyse
Neuschaefer-Rube, Ulrich, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 5.3, Koordinatenmesstechnik
Tutsch, Rainer, Institut für Produktionsmesstechnik, TU Braunschweig
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Resource Type: Text / Conference Article
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: Download for personal/private use only, if your national copyright law allows this kind of use.
Relationships: IsIdenticalTo: DOI 10.1117/12.2673432
Dates: Available: 2024-06-21
Created: 2023-08-10
File: Download File (application/pdf) 1.11 MB (1166047 Bytes)
MD5 Checksum: 893969de8680d0e534ab9d30776b8190
SHA256 Checksum: 9c1815a7007c0b51048cea60fd0d09313cd9e64084cf3e144b6095efab16647c
Keywords optical metrology ; modeling ; ray tracing ; BRDF ; chromatic confocal ; systematic errors ; traceability
Abstract: One important cause for limited traceability in optical metrology is the presence of systematic measurement errors caused by the interaction of the sensor and the measured object. These effects are complex and influenced by many factors, hence, they may differ significantly even among similar measurement systems. This also implies, that it is usually necessary to model the whole measurement chain including the relevant characteristics of the measured surface.

We are currently developing a model of a chromatic confocal point sensor dedicated to simulate object-dependent systematic measurement errors and estimating task-specific measurement uncertainties. The simulations already cover all relevant fundamental aspects of the system, some important details are currently being developed. We recently introduced realistic reflection characteristics based on methods originating in physically based rendering. We show how to phenomenologically describe the light-object-interaction using bidirectional reflectance distribution functions and how the principle of Monte Carlo Ray Tracing can be adopted for this use case.

We can already show the general influence of surface curvature and slope and can qualitatively predict systematic effects. However, simulations using the current model still show clear deviations from measurement results. While some effects are caused by non-ideal characteristics of the real system, others are likely caused by the approximations within our model. Therefore, further investigations and model developments are pursued.
Funding: European Commission (EC), ISNI: 0000 0001 2162 673X, Grant Title: Traceable industrial 3D roughness and dimensional measurement using optical 3D microscopy and optical distance sensors, Grant Number: EMPIR 20IND07