Title: Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width
Authors: Phung, Gia Ngoc, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0001-7157-1263
Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0003-0372-2626
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:4
Language:en
DOI:10.7795/810.20201023
Resource Type: Text / Article
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: Download for personal/private use only, if your national copyright law allows this kind of use.
Dates: Available: 2020-10-23
File: Download File (application/pdf) 1.04 MB (1095445 Bytes)
MD5 Checksum: 1905358e6f7d8131f75835e13084ccca
SHA256 Checksum: ef97bb5452e0a56af1c180cbf693adb28b381cbbe154593e74acf1a98304ad1d
Keywords: Coplanar waveguides ; Probes ; Microwave measurement ; Calibration ; Simulation ; Microwave communication
Abstract: On-wafer measurements contain a large variety of parasitic effects degrading the accuracy of multiline Thru-Reflect Line (mTRL) calibration. These effects are caused by internal and external disturbances such as probe effects, multimode propagation, crosstalk between adjacent structures and radiation effects. While a lot of investigations have been performed for the most common coplanar waveguides (CPW) with nominal ground width, CPW with too narrow ground width have not been investigated thoroughly. This paper demonstrates how the probe effects deteriorate the mTRL-calibrated S-parameters for CPW structures with narrow ground width.
Citation: G. N. Phung and U. Arz, "Parasitic Probe Effects in Measurements of Coplanar Waveguides with Narrow Ground Width," 2020 IEEE 24th Workshop on Signal and Power Integrity (SPI), Cologne, Germany, 2020, pp. 1-4, doi: 10.1109/SPI48784.2020.9218166.