Titel: Synthetic wavelength based transportable telemeter with submicrometer resolution
Autoren: Azouigui, Sheherazade, ISNI: 0000 0003 5809 2000
Wallerand, Jean-Pierre
Badr, Thomas, ISNI: 0000 0003 5896 2432
van den Berg, Steven
Himbert, Marc
Juncar, Patrick
Beitragende: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Seiten:8
Sprache:en
DOI:10.7795/810.20130620M
Art der Ressource: Text / Report
Herausgeber: Physikalisch-Technische Bundesanstalt (PTB)
Daten: Verfügbar: 2013
Veröffentlicht: 2013-08
Datei: Datei herunterladen (application/pdf) 412.29 kB (422190 Bytes)
MD5 Prüfsumme: 715cf9d2683f50e540cbafdd8c280ab4
SHA256 Prüfsumme: d3e6e0a47314bc5c5d82e0fc27f5548f04b9295550efbd40e3d10daf67e5c2d6
Zusammenfassung: We describe a transportable system based on synthetic wavelength interferometry for absolute distance measurement. The synthetic wavelength is generated using two frequency-doubled Nd:YAG lasers. Main feature is the elimination of polarization cross-talk issue using a setup where spatial separation is preferred to polarization separation. A superheterodyne technique has been implemented to detect the synthetic phase, enabling a fringe interpolation of ~2 pi/5600. A resolution of 700 nm over 60 s of integration time is demonstrated for a synthetic wavelength of 7,5 mm. An accuracy better than 10 μm is demonstrated over 25 m, based on an indoor comparison with a classical fringe counting interferometer at VSL (Netherlands).
Anderes: article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011
Zitierform: AZOUIGUI, Sheherazade, Jean-Pierre WALLERAND, Thomas BADR, Steven van den BERG, Marc HIMBERT, and Patrick JUNCAR. Synthetic wavelength based transportable telemeter with submicrometer resolution. Physikalisch-Technische Bundesanstalt (PTB), 2013. doi: 10.7795/810.20130620M
Bemerkung: article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011