| Title: | Synthetic wavelength based transportable telemeter with submicrometer resolution |
| Authors: |
Azouigui, Sheherazade, Laboratoire Commun de Métrologie (LNE-CNAM), La Plaine Saint Denis, France, ISNI: 0000 0003 5809 2000 Wallerand, Jean-Pierre, Laboratoire Commun de Métrologie (LNE-CNAM), La Plaine Saint Denis, France Badr, Thomas, Laboratoire Commun de Métrologie (LNE-CNAM), La Plaine Saint Denis, France, ISNI: 0000 0003 5896 2432 van den Berg, Steven, VSL, Delft, The Netherlands Himbert, Marc, Laboratoire Commun de Métrologie (LNE-CNAM), La Plaine Saint Denis, France Show all authors (6) |
| Contributors: | HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887 |
| Pages: | 8 |
| Language: | en |
| DOI: | 10.7795/810.20130620M |
| Resource Type: | Text / Report |
| Publisher: | Physikalisch-Technische Bundesanstalt (PTB) |
| Dates: |
Available: 2013 Issued: 2013-08 |
| File: |
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| Abstract: | We describe a transportable system based on synthetic wavelength interferometry for absolute distance measurement. The synthetic wavelength is generated using two frequency-doubled Nd:YAG lasers. Main feature is the elimination of polarization cross-talk issue using a setup where spatial separation is preferred to polarization separation. A superheterodyne technique has been implemented to detect the synthetic phase, enabling a fringe interpolation of ~2 pi/5600. A resolution of 700 nm over 60 s of integration time is demonstrated for a synthetic wavelength of 7,5 mm. An accuracy better than 10 μm is demonstrated over 25 m, based on an indoor comparison with a classical fringe counting interferometer at VSL (Netherlands). |
| Other: | article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011 |
| Citation: | AZOUIGUI, Sheherazade, Jean-Pierre WALLERAND, Thomas BADR, Steven van den BERG, Marc HIMBERT, and Patrick JUNCAR. Synthetic wavelength based transportable telemeter with submicrometer resolution. Physikalisch-Technische Bundesanstalt (PTB), 2013. doi: 10.7795/810.20130620M |
| Remark: | article based on oral presentation at the conference MacroScale 2011 "Recent developments in traceable dimensional measurements", Bern-Wabern (Switzerland), 04-06, October, 2011 |