This dataset contains around 60,000 images showing thickness maps of simulated soot aggregates.
We used a software [1] to simulate diffusion-limited aggregation of around 20,000 fractal aggregates. Their fractal dimension ranges from 1.5 to 1.85 representing fresh soot. The diameters of the primary particles are log-normal distributed, and their overlap was chosen between point contact (C_ov=0) and 40% (C_ov=0.4 ).
For each aggregate, 2D representations in the form of thickness maps were determined for three random orientations (this dataset).
Electron microscopic images may be approximated from thickness maps in a simple manner using a signal yield curve which describes the relationship between thickness and signal strength, e.g. generically following Beer’s law. Thus, the user can easily generate custom/individual electron microscopic images.
Alternatively, STEM-in-SEM micrographs are available (see dataset DOI XXX) which were acquired using a a specific yield curve for STEM-in-SEM based on Monte-Carlo-Simulations.