Title: Dataset for the publication "A Ti/Pt/Co Multilayer Stack for Transfer Function Based Magnetic Force Microscopy Calibrations summary"
Authors: Sakar, Baha, Gebze Technical University, Kocaeli, Turkey, ORCID: 0000-0002-7076-6322
Sievers, Sibylle, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.5, Halbleiterphysik und Magnetismus, ORCID: 0000-0002-6848-8984
Fernández Scarioni, Alexander, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.5, Halbleiterphysik und Magnetismus, ORCID: 0000-0003-2244-2582
García-Sánchez, Felipe, University of Salamanca, Salamanca, Spain, ORCID: 0000-0002-3655-4836
Öztoprak, Ilker, Gebze Technical University, Kocaeli, Turkey, ORCID: 0000-0001-9060-2627

Show all authors (7)
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Language:en
DOI:10.7795/720.20220111
Resource Type: Dataset / Measurement Data
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: https://creativecommons.org/licenses/by/4.0/
CC-BY 4.0 International
Relationships: IsReferencedBy: DOI 10.3390/magnetochemistry7060078
Dates: Available: 2022-01-11
Classifications: INSPEC A0620H Measurement standards and calibration ; INSPEC A0779 Scanning probe microscopy and related techniques ; INSPEC A6116P Scanning probe microscopy determinations of structures ; INSPEC B7130 Measurement standards and calibration ; INSPEC B7200 Measurement equipment and instrumentation systems ; INSPEC E1650 Standards and calibration
File: Download File (application/zip) 653.68 MB (685435215 Bytes)
MD5 Checksum: b6f0ee84788696bf2e2c194318050d6a
SHA256 Checksum: dfcb0b49a1b5c3d8f4f7a20a61e1518b8c5c7a38516d57dcf87c52490cd892a6
Keywords: magnetic force microscopy ; calibration ; calibration reference samples ; micromagnetics ; metrology for magnetism ; magnetic multilayers
Abstract: Magnetic force microscopy (MFM) is a widespread technique for imaging magnetic structures with a resolution of some 10 nanometers. MFM can be calibrated to obtain quantitative (qMFM) spatially resolved magnetization data in units of A/m by determining the calibrated point spread function of the instrument, its instrument calibration function (ICF), from a measurement of a well-known reference sample. Beyond quantifying the MFM data, a deconvolution of the MFM image data with the ICF also corrects the smearing caused by the finite width of the MFM tip stray field distribution. However, the quality of the calibration depends critically on the calculability of the magnetization distribution of the reference sample. Here, we discuss a Ti/Pt/Co multilayer stack that shows a stripe domain pattern as a suitable reference material. A precise control of the fabrication process, combined with a characterization of the sample micromagnetic parameters, allows reliable calculation of the sample’s magnetic stray field, proven by a very good agreement between micromagnetic simulations and qMFM measurements. A calibrated qMFM measurement using the Ti/Pt/Co stack as a reference sample is shown and validated, and the application area for quantitative MFM measurements calibrated with the Ti/Pt/Co stack is discussed.
Other: EMPIR projects are co-funded by the European Union’s (EU) Horizon 2020 research and innovation programme and the EMPIR participating states.
Remark: description of the individual files:
# MFM:
Description: Magnetic force microscopy phase shift values: (N5R20) Ti/Pt/Co or (ref) reference sample
Format: tab-separated numerical matrices with header
Software: Gwyddion, http://gwyddion.net/ or any text editor
# MuMax3:
Description: Simulation results for domain nucleation 1 / 2 / 3
Format: .ovf
Software: MuMax3, https://mumax.github.io/
# VSM\Pictures of the samples:
Description: Pictures of the samples used for calculating surface area
Format: (1) .jpg for images, (2) .txt for additional information
Software: (1) any jpg viewer, (2) any text editor
# VSM\VSM data:
Description: Vibrating sample magnetometer data for (IP) in plane or (OP) out of plane measurements
Format: comma-separated numerical matrices with header
Software: any text editor
# Roughness:
Description: AFM data for roughness characterization (settings + results)
Format: Ascii for settings; Tab-separated numerical matrices for results
Software: any text editor
# Thickness:
Description: XPS data for thickness calibration
Format: .itx: space-separated numerical matrices with header
Software: IgorPro, www.wavemetrics.com/products/
# XPS:
Description: XPS data of the Ti/Pt/Co sample (intensity, arbitrary units)
Format: CR separated numerical data with header
Software: any text editor
Funding: Scientific and Technological Research Council of Turkey (TÜBİTAK), ISNI: 0000 0001 0685 2712, Grant Title: The Scientific and Technological Research Projects Funding Program, Grant Number: 1001/119M287
Scientific and Technological Research Council of Turkey (TÜBİTAK), ISNI: 0000 0001 0685 2712, Grant Title: International Research Fellowship Program for PhD Students, Grant Number: 2214-A/1059B141800226
European Commission (EC), ISNI: 0000 0001 2162 673X, Grant Title: Metrology for topological spin structures, Grant Number: EMPIR 17FUN08 TOPS