Title:
Title:
Roughness Metrology: Conversion of profiles from measurements with reference plane profilometers into skidded probe profiles : Expert report DKD-E 4-2
Authors:
Authors:
Hüser, Dorothee, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 5.1, Oberflächenmesstechnik, ORCID: 0000-0002-2208-4490
Volk, Raimund, JENOPTIK Industrial Metrology, Villingen-Schwenningen, ORCID: 0009-0003-1796-0315
Schwarzer, Florian, JENOPTIK Industrial Metrology, Villingen-Schwenningen, ORCID: 0009-0005-9521-5825
Feifel, Stefan, JENOPTIK Industrial Metrology, Villingen-Schwenningen, ORCID: 0009-0000-9285-8722
Contributors:
Contributors:
HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:
Pages:
25
Languages:
Languages:
en
DOI:
DOI:
10.7795/550.20250207
Version:
Version:
01/2025
Resource Type:
Resource Type:
Text / Technical Requirement
Publisher:
Publisher:
Physikalisch-Technische Bundesanstalt (PTB)
Rights:
Rights:
https://creativecommons.org/licenses/by-nc-nd/3.0/de/
CC by-nc-nd 3.0
Relationships:
Relationships:
IsVariantFormOf: DOI 10.7795/550.20250116
Dates:
Dates:
Available: 2025-02-07
Created: 2025-01
File:
File:
Download File (application/pdf) 1.78 MB (1870113 Bytes)
MD5 Checksum: d50d7e8b8d06e3c1c0249c31723c0bd6
SHA256 Checksum: e5d56fffb46120f9a32c9b6b7340a0497518acd541fdd4029b32a16ef032089c
Keywords:
Keywords:
DKD expert report ; profilometer ; roughness ; stylus instrument ; skidded probe ; stylus tip ; double-skid probe ; EN 10049
Abstract:
Abstract:
This expert report presents a procedure for the calibration of roughness standards used to represent the surface quality of sheet metal, which makes it possible to dispense with the use of double-skid probes during calibration.
When using this procedure, profiles acquired with reference plane profilers are converted into skid probe profiles. This is relevant for the maximum height parameters, Rz, Rzmax und Rzx . For thin sheets with typical Rz values in the range of 5 µm to 5,5 µm, the results of skid and reference plane profilers differ by approximately 0,6 µm. The uncertainty of the skidless to skidded transformation procedure is approximately 0,1 µm. There is no significant change in the values when determining the arithmetic mean height Ra and the peak value RPc or Rpc , so there is no need to convert those values.
The skidless to skidded transformation method helps to reduce time needed for modification and adjustment of the measuring set-up, and it eliminates uncertainty components due to form and position tolerances of the double-skid probes. Reduction of the smallest accredited measurement uncertainties is therefore recommended.
Citation:
Citation:
Expert report DKD-E 4-2 Roughness Metrology: Conversion of profiles from measurements with reference plane profilometers into skidded probe profiles, Edition 01/2025, Revision 0, Physikalisch-Technische Bundesanstalt, Braunschweig and Berlin. DOI: 10.7795/550.20250207.

Authors

Hüser, Dorothee, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 5.1, Oberflächenmesstechnik, ORCID: 0000-0002-2208-4490
Volk, Raimund, JENOPTIK Industrial Metrology, Villingen-Schwenningen, ORCID: 0009-0003-1796-0315
Schwarzer, Florian, JENOPTIK Industrial Metrology, Villingen-Schwenningen, ORCID: 0009-0005-9521-5825
Feifel, Stefan, JENOPTIK Industrial Metrology, Villingen-Schwenningen, ORCID: 0009-0000-9285-8722

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