Title: Secondary Parameters of technologically relevant materials and their relation to quantitative MOIF measurements
Authors: Sievers, Sibylle, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.5, Halbleiterphysik und Magnetismus
Dorosinskiy, Lev, TUBITAK National Metrology Institute
Linder, Morris, INNOVENT e. V. Technologieentwicklung
Weking, Gerd, International Standards Consulting
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:4
Language:en
DOI:10.7795/530.20230323A
Resource Type: Text / Guide
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: Vervielfältigung nur zum eigenen persönlichen Gebrauch.
Dates: Available: 2023-04-13
File: Download File (application/pdf) 520.87 kB (533368 Bytes)
MD5 Checksum: a1ee52c2cfb422a84298c7008b9373ef
SHA256 Checksum: 25f33cb38734bae53d1569ecddb9de1894701642b05a788bdfb37690b5c0e8dc
Keywords MOIF ; magneto-optical indicator films ; local magnetic field measurements
Abstract: This document lists secondary parameters of magnetic encoders and describes an approach to determine these secondary parameters of real scales using qMOIF combined with mathematical analysis tools.
Citation: Sievers, Sibylle ; et al. Secondary Parameters of technologically relevant materials and their relation to quantitative MOIF measurements . Physikalisch-Technische Bundesanstalt (PTB), 2023. DOI: https://doi.org/10.7795/530.20230323A
Funding: European Commission (EC), ISNI: 0000 0001 2162 673X, Grant Title: Standardization of a quantitative magneto-optical indicator film based magnetic field measurement technique, Grant Number: EMPIR 20SIP04 qMOIF