| Title: | Secondary Parameters of technologically relevant materials and their relation to quantitative MOIF measurements |
| Authors: |
Sievers, Sibylle, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.5, Halbleiterphysik und Magnetismus Dorosinskiy, Lev, TUBITAK National Metrology Institute Linder, Morris, INNOVENT e. V. Technologieentwicklung Weking, Gerd, International Standards Consulting |
| Contributors: | HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887 |
| Pages: | 1 |
| Language: | en |
| DOI: | 10.7795/530.20230323A |
| Resource Type: | Text / Guide |
| Publisher: | Physikalisch-Technische Bundesanstalt (PTB) |
| Rights: | Vervielfältigung nur zum eigenen persönlichen Gebrauch. |
| Dates: |
Available: 2023-04-13 |
| File: |
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| Keywords: | MOIF ; magneto-optical indicator films ; local magnetic field measurements |
| Abstract: | This document lists secondary parameters of magnetic encoders and describes an approach to determine these secondary parameters of real scales using qMOIF combined with mathematical analysis tools. |
| Citation: | Sievers, Sibylle ; et al. Secondary Parameters of technologically relevant materials and their relation to quantitative MOIF measurements . Physikalisch-Technische Bundesanstalt (PTB), 2023. DOI: https://doi.org/10.7795/530.20230323A |
| Funding: | European Commission (EC), ISNI: 0000 0001 2162 673X, Grant Title: Standardization of a quantitative magneto-optical indicator film based magnetic field measurement technique, Grant Number: EMPIR 20SIP04 qMOIF |