| Title: |
Title:
Secondary Parameters of technologically relevant materials and their relation to quantitative MOIF measurements
|
| Authors: |
Authors:
Sievers, Sibylle, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.5, Halbleiterphysik und MagnetismusDorosinskiy, Lev, TUBITAK National Metrology Institute Linder, Morris, INNOVENT e. V. Technologieentwicklung Weking, Gerd, International Standards Consulting |
| Contributors: |
Contributors:
HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
|
| Pages: |
Pages:
4
|
| Languages: |
Languages:
en
|
| DOI: |
DOI:
10.7795/530.20230323A
|
| Resource Type: |
Resource Type:
Text / Guide
|
| Publisher: |
Publisher:
Physikalisch-Technische Bundesanstalt (PTB)
|
| Rights: |
Rights:
Vervielfältigung nur zum eigenen persönlichen Gebrauch.
|
| Dates: |
Dates:
Available: 2023-04-13 |
| File: |
File:
Download File
(application/pdf)
520.87 kB (533368 Bytes)
MD5 Checksum: a1ee52c2cfb422a84298c7008b9373ef SHA256 Checksum: 25f33cb38734bae53d1569ecddb9de1894701642b05a788bdfb37690b5c0e8dc |
| Keywords: |
Keywords:
MOIF ;
magneto-optical indicator films ;
local magnetic field measurements
|
| Abstract: |
Abstract:
This document lists secondary parameters of magnetic encoders and describes an approach to determine these secondary parameters of real scales using qMOIF combined with mathematical analysis tools.
|
| Citation: |
Citation:
Sievers, Sibylle ; et al. Secondary Parameters of technologically relevant materials and their relation to quantitative MOIF measurements . Physikalisch-Technische Bundesanstalt (PTB), 2023. DOI: https://doi.org/10.7795/530.20230323A
|
| Funding: |
Funding:
European Commission (EC), ISNI: 0000 0001 2162 673X, Grant Title: Standardization of a quantitative magneto-optical indicator film based magnetic field measurement technique, Grant Number: EMPIR 20SIP04 qMOIF
|
-OAR
