Title: Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers : EMPIR - 14IND02 PlanarCal
Authors: Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0003-0372-2626
Probst, Thorsten, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder
Kuhlmann, Karsten, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder
Ridler, Nick, National Physical Laboratory, Teddington, U.K.
Shang, Xiaobang, National Physical Laboratory, Teddington, U.K.
Mubarak, Faisal, VSL-Dutch Metrology Institute, Delft, THE NETHERLANDS, ORCID: 0000-0003-4774-9038
Hoffmann, Johannes, METAS, Bern, SWITZERLAND
Wollensack, Michael, METAS, Bern, SWITZERLAND
Zeier, Markus, METAS, Bern, SWITZERLAND
Phung, Gia Ngoc, Ferdinand-Braun-Institut für Höchstfrequenztechnik (FBH), Berlin, ORCID: 0000-0001-7157-1263
Heinrich, Wolfgang, Ferdinand-Braun-Institut für Höchstfrequenztechnik (FBH), Berlin
Lomakin, Konstantin, Friedrich-Alexander University Erlangen-Nuremberg (FAU), Erlangen
Gold, Gerald, Friedrich-Alexander University Erlangen-Nuremberg (FAU), Erlangen
Helmreich, Klaus, Friedrich-Alexander University Erlangen-Nuremberg (FAU), Erlangen
Lozar, Roger, Fraunhofer Institute for Applied Solid State Physics, Freiburg
Dambrine, Gilles, University of Lille, IEMN UMR CNRS 8520, Villeneuve-d’Ascq Cedex, FRANCE
Haddadi, Kamel, University of Lille Villeneuve-d’Ascq Cedex, FRANCE
Spirito, Marco, Delft University of Technology, Delft, THE NETHERLANDS
Clarke, Roland, University of Leeds, Leeds, U.K.
Contributors: HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887
Pages:64
Language:en
DOI:10.7795/530.20190424B
Resource Type: Text / Guide
Publisher: Physikalisch-Technische Bundesanstalt (PTB)
Rights: https://creativecommons.org/licenses/by/4.0/
CC BY 4.0
Dates: Available: 2019-04-24
Created: 2018-09
File: Download File (application/pdf) 5.68 MB (5952785 Bytes)
MD5 Checksum: e2bb74247aef2c32caeb3c4cc79dd21b
SHA256 Checksum: 0c1c161d3dc3ef823c0a39ae0ddbefa6feb72745ea3ecb10df5e32b8aa64211b
Keywords: Calibration ; on-wafer ; S-parameters ; traceability ; uncertainty budget ; coplanar waveguide (CPW) ; electromagnetic field simulation ; parasitic modes ; substrate modes ; multiline-thru-reflect-line (mTRL) ; microwave probes ; extreme impedance measurement ; impedance mismatch ; microwave interferometry ; nanoelectronics ; nanostructures ; noise ; vector network analyzer (VNA)
Abstract: In the European project PlanarCal a major effort has been undertaken to characterise components and devices for eventual use in high-speed and microwave applications (e.g. wireless communications, automotive radar and medical sensing) with known measurement uncertainties. It is the purpose of this Best Practice Guide to give an overview of the major outcomes of this project together with useful information on recommended measurement practice, different sources of uncertainty and the determination of uncertainties. This Best Practice Guide is not intended to replace available literature which offers comprehensive introductions to the subject of on-wafer measurements and deembedding. Instead, this Guide aims to present useful best practice recommendations together with key takeaways developed from the research performed in PlanarCal during the project’s lifetime from 2015 until 2018.
Citation: Arz, Uwe ; Probst, Thorsten ; Kuhlmann, Karsten ; Ridler, Nick ; Shang, Xiaobang ; Mubarak, Faisal ; Hoffmann, Johannes ; Wollensack, Michael ; Zeier, Markus ; Phung, Gia Ngoc ; Heinrich, Wolfgang ; Lomakin, Konstantin ; Gold, Gerald ; Helmreich, Klaus ; Lozar, Roger ; Dambrine, Gilles ; Haddadi, Kamel ; Spirito, Marco ; Clarke, Roland. Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers : EMPIR — 14IND02 PlanarCal, 2018. Physikalisch-Technische Bundesanstalt (PTB). DOI: https://doi.org/10.7795/530.20190424B