| Titel: | Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers : EMPIR - 14IND02 PlanarCal |
| Autoren: |
Arz, Uwe, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder, ORCID: 0000-0003-0372-2626 Probst, Thorsten, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder Kuhlmann, Karsten, Physikalisch-Technische Bundesanstalt (PTB), Fachbereich 2.2, Hochfrequenz und Felder Ridler, Nick, National Physical Laboratory, Teddington, U.K. Shang, Xiaobang, National Physical Laboratory, Teddington, U.K. Alle Autoren anzeigen (19) |
| Beitragende: | HostingInstitution: Physikalisch-Technische Bundesanstalt (PTB), ISNI: 0000 0001 2186 1887 |
| Seiten: | 64 |
| Sprache: | en |
| DOI: | 10.7795/530.20190424B |
| Art der Ressource: | Text / Guide |
| Herausgeber: | Physikalisch-Technische Bundesanstalt (PTB) |
| Rechte: |
https://creativecommons.org/licenses/by/4.0/ CC BY 4.0 |
| Daten: |
Verfügbar: 2019-04-24 Erstellt: 2018-09 |
| Datei: |
Datei herunterladen
(application/pdf)
5.68 MB (5952785 Bytes)
MD5 Prüfsumme: e2bb74247aef2c32caeb3c4cc79dd21b SHA256 Prüfsumme: 0c1c161d3dc3ef823c0a39ae0ddbefa6feb72745ea3ecb10df5e32b8aa64211b |
| Schlagworte | Calibration ; on-wafer ; S-parameters ; traceability ; uncertainty budget ; coplanar waveguide (CPW) ; electromagnetic field simulation ; parasitic modes ; substrate modes ; multiline-thru-reflect-line (mTRL) ; microwave probes ; extreme impedance measurement ; impedance mismatch ; microwave interferometry ; nanoelectronics ; nanostructures ; noise ; vector network analyzer (VNA) |
| Zusammenfassung: | In the European project PlanarCal a major effort has been undertaken to characterise components and devices for eventual use in high-speed and microwave applications (e.g. wireless communications, automotive radar and medical sensing) with known measurement uncertainties. It is the purpose of this Best Practice Guide to give an overview of the major outcomes of this project together with useful information on recommended measurement practice, different sources of uncertainty and the determination of uncertainties. This Best Practice Guide is not intended to replace available literature which offers comprehensive introductions to the subject of on-wafer measurements and deembedding. Instead, this Guide aims to present useful best practice recommendations together with key takeaways developed from the research performed in PlanarCal during the project’s lifetime from 2015 until 2018. |
| Zitierform: | Arz, Uwe ; Probst, Thorsten ; Kuhlmann, Karsten ; Ridler, Nick ; Shang, Xiaobang ; Mubarak, Faisal ; Hoffmann, Johannes ; Wollensack, Michael ; Zeier, Markus ; Phung, Gia Ngoc ; Heinrich, Wolfgang ; Lomakin, Konstantin ; Gold, Gerald ; Helmreich, Klaus ; Lozar, Roger ; Dambrine, Gilles ; Haddadi, Kamel ; Spirito, Marco ; Clarke, Roland. Best Practice Guide for Planar S-Parameter Measurements using Vector Network Analysers : EMPIR — 14IND02 PlanarCal, 2018. Physikalisch-Technische Bundesanstalt (PTB). DOI: https://doi.org/10.7795/530.20190424B |